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In situ bending of a Cu nanowhisker in a scanning electron microscope

Bending of a nanowhisker in situ in a scanning electron microscope. The bending occurs due to the presence of an electric field, and the whisker is moved through the field, causing more bending.... 

Tensile testing of a Cu nanowhisker

In situ straining of a 70 nm Cu nanowhisker in a scanning electron microscope. Digital image correlation is used to calculate the displacement field along the wire during testing. Share... 

Trestles laser installation at NIST Quantum Communication Lab

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Nanowire Books

Low-Dimensional Solids

Product DescriptionWith physical properties that often may not be described by the transposition of physical laws from 3D space across to 2D or even 1D space, low-dimensional solids exhibit a high degree... 

Atomic and Molecular Wires

Product DescriptionThere is a growing interest in the connection of a single molecule or a wire of atomic diameter between two electrodes. This has led to the investigation of a new class of nanoscale... 

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