Electromigration in a gold nanowire
March 3, 2010 by AboutNanoWires.com
TEM inspection of the electromigration process (Delft University of Technology). More about this work can be found at: In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy. HB Heersche, , G. Lientschnig, K. Oneill, HSJ van der Zant and HW Zandbergen. Appl. Phys. Lett. 91, 72107-1-72107-3 (2007).
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