Grazing Incidence X-Ray Diffraction of InAs NW

X-ray diffraction of inas vertically free-standing nanowire grown on gaas (111)B. The Hubbler diffractometer was setting up to measure in Grazing Incidence X-Ray Diffraction (GIXRD or GID) on (2,-2,0) direction. The inas islands, nanowires and gaas substrate peaks can be seen.