Optical Properties of Nanostructured Random Media (Topics in Applied Physics)

Optical Properties of Nanostructured Random Media (Topics in Applied Physics)

Reviews recent advances in the nonlinear optics of nanostructured composite materials. The contributing authors are world best experts in the field and provide a state of the art description of the world of the optics of random media.

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Applied Scanning Probe Methods IV: Industrial Applications (v. 4) Reviews

Applied Scanning Probe Methods IV: Industrial Applications (v. 4)

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods VI (v. 6)

This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Applied Scanning Probe Methods III: Characterization (v. 3)

Applied Scanning Probe Methods III: Characterization (v. 3)

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (v. 2)

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (v. 2)

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

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Optical Nanotechnologies : The Manipulation of Surface and Local Plasmons (Topics in Applied Physics)

Optical Nanotechnologies : The Manipulation of Surface and Local Plasmons (Topics in Applied Physics)

This book treats the phenomena and techniques of advanced optics confined in nanometer-scale regions, especially near-field optics and surface as well as local plasmons. Written by internationally distinguished scientists the coverage extends from the basics to the most advanced technologies, system characteristics and methods of manipulation.

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