http://aboutnanowires.com Nanowires, News, Products, Jobs, White Papers.... Sun, 15 Apr 2012 13:06:18 +0000 en hourly 1 http://wordpress.org/?v=3.3.1 http://aboutnanowires.com/169/automatic-localization-of-carbon-nanotubes-in-the-scanning-electron-mircoscope/ http://aboutnanowires.com/169/automatic-localization-of-carbon-nanotubes-in-the-scanning-electron-mircoscope/#comments Wed, 03 Mar 2010 20:17:53 +0000 AboutNanoWires.com http://aboutnanowires.com/?p=169
When doing automated assembly on the nanoscale, the localization and indexing of the nanoscale objects is challenging. The video shows how a silicon wafer containing cnts is scanned for the single cnts in the SEM. The procedure starts at a low magnification, providing automatic zooming and image optimisation (focus, brightness/contrast) for CNT-localization. The cnts are then magnified in several steps, until tip and bottom end of each CNT is automatically registered. This step is the starting point for any automated assembly process on the nanoscale.

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