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Ferroelectric nanotubes: “soft template infiltration” technique fabricates free-standing piezoelectric nanostructures from PZT material

February 23, 2012 by · Leave a Comment 


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Sub-pm deformations reveal ferroelectric domains

November 30, 2011 by · Leave a Comment 

Improved understanding of piezoresponse force microscopy detection mechanism leads to quantitative analysis of data beyond simple mapping of domain patterns
nanotechweb.org: lab talk

Integrating core/shell ferroelectric nanostructures on silicon substrates

March 20, 2011 by · Leave a Comment 

BFO-covered ZnO arrays could be used in piezoelectric and photovoltaic applications
nanotechweb.org: lab talk

Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

July 27, 2010 by · Leave a Comment 

Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

This book is a basic introduction to the field of nanoscale measurements of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy, as well as basic physics at the nanoscale level in ferroelectrics, including nanoscale switching, scaling effects, and transport mechanisms. It will be a useful reference both for specialists and for newcomers or graduate students.

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Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

May 28, 2010 by · Leave a Comment 

Product Description
This book is a basic introduction to the field of nanoscale measurements of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy, as well as basic physics at the nanoscale level in ferroelectrics, including nanoscale switching, scaling effects, and transport mechanisms. It will be a useful reference both for specialists and for newcomers or graduate students.

BUY FROM AMAZON–>> Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

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