Applied Scanning Probe Methods III: Characterization

Product Description

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Nanocrystalline Materials: Their Synthesis-Structure-Property Relationships and Applications

Product Description
Nanocrystalline materials with new functionalities show great promise for use in industrial applications – such as reinforcing fillers in novel polymer composites – and substantial progress has been made in the past decade in their synthesis and processing. However, there are several issues that need to be addressed to develop these materials further. Among these, exploration of novel methods for the large-scale synthesis of low cost self-assembled nanostructures is a challenging research topic. Accordingly, there has emerged a demand to study their synthesis-structure-property relationships in order to understand the fundamental concepts underlying the observed physical and mechanical properties.

With contributions from leading experts, this book describes the fundamental theories and concepts that illustrate the complexity of the problem in developing novel nanocrystalline materials. It reviews the most up-to-date progress in the synthesis, microstructural characterization, physical and mechanical behavior, and application of nanomaterials.

* Investigates the synthesis, characterisation and properties of a huge variety of nanocrystalline materials, and their applications in industry
* Keeps the prominent challenges in nanomaterials fabrication at the forefront while offering the most up-to-date scientific findings

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Nanoclusters and Nanocrystals

Product Description
Nanoclusters and Nanocrystals provides coverage on various aspects of nanoclusters and nanocrystals. This book covers topics on recent synthetic strategies to fabricate metallic or semiconducting nanoscale clusters and crystals, nanocrystalline films, control of size and shape of clusters and crystals, growth mechanism, spectroscopic characterization, amorphous and crystalline structures, physical properties and potential industrial applications in transducers and photocatalysis. This book is an essential resource for scientists, researchers, upper-level undergraduate and graduate students, college and university professors, working in the field of electrical and electronic engineering, materials science, solid-state physics, nanotechnology, crystal engineering, cluster science, computational engineering, device applications, etc.

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Applied Scanning Probe Methods XII: Characterization

Product Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

Product Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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