Scanning Probe Microscopy: Analytical Methods

Scanning Probe Microscopy: Analytical Methods

Scanning Probe Microscopy – Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.

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Multiscale Simulation Methods for Nanomaterials

Multiscale Simulation Methods for Nanomaterials

This book stems from the American Chemical Society symposium, Large Scale Molecular Dynamics, Nanoscale, and Mesoscale Modeling and Simulation: Bridging the Gap, that delved into the latest methodologies and applications for largescale, multiscale, and mesoscale modeling and simulation. It presents real-world applications of simulated and synthesized materials, including organic-, inorganic-, bio-, and nanomaterials, and helps readers determine the best method for their simulation. It gets novices up to speed quickly and helps experienced practitioners discover novel approaches and alternatives.

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Nano- and Micromaterials (Advances in Materials Research)

The future focus of nanotechnology will be on realizing new functions over greater scales. This book describes the creation of nano- and microscale structures and functions by controlling temperature, light, pressure, or carrier injections. It covers novel nano-integration technologies such as quantum-well devices possilbe by utilizing, for example, the self-organization of surface nanostructures and optically or pressure-induced phase transitions, micro machines using microstereolithography, as well as new techniques of laser spectroscopy and new computational methods for estimating atomic and electronic structures and their functions on the nano- and microscales.

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Applied Scanning Probe Methods IV: Industrial Applications (v. 4) Reviews

Applied Scanning Probe Methods IV: Industrial Applications (v. 4)

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods VI (v. 6)

This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Applied Scanning Probe Methods III: Characterization (v. 3)

Applied Scanning Probe Methods III: Characterization (v. 3)

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (v. 2)

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (v. 2)

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

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