Advanced Atomic Force Microscopy Technology Workshop

Workshop: 30 Nov 2011, United States.
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Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology) Reviews

Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.

List Price: $ 229.00

Price: $ 168.21

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Introduction to Scanning Electron Microscopy

Course: 28 Oct 2011, Uxbridge, Greater London, United Kingdom. Organized by ETCbrunel.
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The MIP releases quick reference calendar of microscopy and spectroscopy events

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The MIP releases quick reference calendar of microscopy and spectroscopy events

nanotechweb.org: all news

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