Applied Scanning Probe Methods XII: Characterization

Product Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

BUY FROM AMAZON–>> Applied Scanning Probe Methods XII: Characterization

Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

Product Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

BUY FROM AMAZON–>> Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

Applied Scanning Probe Methods X: Biomimetics and Industrial Applications

Product Description

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

BUY FROM AMAZON–>> Applied Scanning Probe Methods X: Biomimetics and Industrial Applications

Applied Scanning Probe Methods V

Product Description

This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

BUY FROM AMAZON–>> Applied Scanning Probe Methods V

Taxation and Technology Transfer: Key Issues – Transfer of Technology for Successful Integration into the Global Economy

Product Description
Technology is often packaged in the form of tangible assets, intangible property, and knowledge and skills. These different forms of technology may be transferred from one country to another through trade in tangible and intangible assets, the provision of services or licensing and leasing agreements, and also as part of FDI. These different modes of transfer and methods of payments may give rise to different tax obligations. This study examines the implications of various tax instruments on the transfer of technology from the perspective of both technology importing and exporting countries. It also identifies some of the tax-related policy instruments than can be used to promote technology transfer to developing countries.

BUY FROM AMAZON–>> Taxation and Technology Transfer: Key Issues – Transfer of Technology for Successful Integration into the Global Economy

« Previous Page — Next Page »