Coaxial Kelvin probe sharpens work-function images

Shielded AFM probe enhances spatial resolution and helps to avoid topographical artifacts by confining the electric field to a region directly below the tip
nanotechweb.org: all news

Scanning probe lithography: ultrasonic vibration assisted nanomachining with an AFM

Controlled ultrasonic tip-sample vibration increases patterning speed and allows tunable feature dimensions
nanotechweb.org: lab talk

Scanning probe lithography: ultrasonic vibration assisted nanomachining with an AFM

Controlled ultrasonic tip-sample vibration increases patterning speed and allows tunable feature dimensions
nanotechweb.org: all news

International Scanning Probe Microscopy Meeting

Conference: 15 Jun 2012 – 18 Jun 2012, Toronto, Ontario, Canada.
nanotechweb.org: events

Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology) Reviews

Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.

List Price: $ 229.00

Price: $ 168.21

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