Texas State University to buy mega microscope
May 29, 2010 by AboutNanoWires.com · Leave a Comment
Texas State University to buy mega microscope
Texas State University will soon buy a $2.2 million scanning electron microscope crucial for the study of nanotechnology, officials said Friday.
Read more on San Antonio Express-News
ATLAS from Carl Zeiss Offers New Opportunities in the Nanoscopic Analysis of Large-area Samples
May 29, 2010 by AboutNanoWires.com · Leave a Comment
ATLAS from Carl Zeiss Offers New Opportunities in the Nanoscopic Analysis of Large-area Samples
Today, Carl Zeiss launches ATLAS™, a powerful hard- and software package, which, in combination with any scanning electron microscope from Carl Zeiss, enables quick and efficient imaging of large-area specimens with nanometer resolution. read more
Read more on SYS-CON Media
Automated Nanohandling by Microrobots
May 19, 2010 by AboutNanoWires.com · Leave a Comment
Product Description
The rapid development of nanotechnology has created a need for advanced nanohandling tools and techniques. One active branch of research in this area focuses on the use of microrobots for automated handling of micro- and nanoscale objects. Automated Nanohandling by Microrobots presents work on the development of a versatile microrobot-based nanohandling robot station inside a scanning electron microscope (SEM). The SEM serves as a powerful vision sensor, providing a high resolution and a high depth of focus, allowing different fields of application to be opened up.
The pre-conditions for using a SEM are high-precision, user-friendly microrobots which can be integrated into the SEM chamber and equipped with application-specific tools. Automated Nanohandling by Microrobots introduces an actuation principle for such microrobots and presents a new robot design. Different aspects of this research field regarding the hardware and software implementation of the system components, including the sensory feedback for automated nanohandling, are discussed in detail. Extensive applications of the microrobot station for nanohandling, nano-characterization and nanostructuring are provided, together with the experimental results.
Based upon the Microrobotics course for students of computer sciences and physics at the University of Oldenburg, Automated Nanohandling by Microrobots provides the practicing engineer and the engineering student with an introduction to the design and applications of robot-based nanohandling devices. Those unfamiliar with the subject will find the text, which is complemented throughout by the extensive use of illustrations, clear and simple to understand.
BUY FROM AMAZON–>> Automated Nanohandling by Microrobots
In situ bending of a Cu nanowhisker in a scanning electron microscope
March 4, 2010 by AboutNanoWires.com · 1 Comment
Bending of a nanowhisker in situ in a scanning electron microscope. The bending occurs due to the presence of an electric field, and the whisker is moved through the field, causing more bending. After moving the whisker back, it returns to its original shape, even after large amounts of deformation.
Tensile testing of a Cu nanowhisker
March 4, 2010 by AboutNanoWires.com · Leave a Comment
In situ straining of a 70 nm Cu nanowhisker in a scanning electron microscope. Digital image correlation is used to calculate the displacement field along the wire during testing.



