Raman Spectroscopy of Carbon Nanotubes under Axial Strain: Raman Spectroscopy of Carbon Nanotubes under Axial Strain and Surface-Enhanced Raman Spectroscopy of Individual Carbon Nanotubes
April 11, 2010 by AboutNanoWires.com · Leave a Comment
Product Description
Resonant Raman spectroscopy of individual carbon nanotube bundles under axial strains up to 17% are presented. This strain causes nanotube debundling which gives insight into the nature of the broad metallic G- band. For metallic nanotubes, the G- band upshifts and narrows with strain, making it appear more semiconductor-like. This metal to semiconductor transition is irreversible with strain, indicating that nanotube-nanotube coupling plays a significant role in the observed G- band of metallic nanotubes. The vibrational and electronic properties of these nanotubes under strain are modeled using tight-binding calculations. A systematic study of surface enhanced Raman spectroscopy (SERS) of carbon nanotubes. Raman spectra of individual carbon nanotubes are measured before and after depositing silver nanoparticles. Regions exhibiting SERS enhancement were located relative to a grid, allowing subsequent scanning electron microscopy to be performed. SERS enhancement factors up to 134,000, a consistent upshift in the G band Raman frequency and nanoparticle heating in excess of 600°C are revealed.
Scanning Microscopy for Nanotechnology: Techniques and Applications
March 23, 2010 by AboutNanoWires.com · Leave a Comment
Product Description
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
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