Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques

Product Description

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

Product Description

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes – which belong together – contributes further to the evolution of SPM techniques.

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Product Description

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument’s operation, and theorists will understand how simulations can be directly compared to experimental data.

 

Key Features

• Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
• Provides a framework for linking scanning probe theory and simulations with experimental data
• Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

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Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

Product Description
This book is a basic introduction to the field of nanoscale measurements of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy, as well as basic physics at the nanoscale level in ferroelectrics, including nanoscale switching, scaling effects, and transport mechanisms. It will be a useful reference both for specialists and for newcomers or graduate students.

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Nanotribology and Nanomechanics: An Introduction

Product Description

This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems, MEMS/NEMS and BioMEMS/bioNEMS. Assuming some familiarity with macrotribology/mechanics, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts. After reviewing the fundamental experimental and theoretical aspects in the first part, Nanotribology and Nanomechanics then treats applications.

Three groups of readers are likely to find this text valuable: graduate students, research workers, and practicing engineers. It can serve as the basis for a comprehensive, one- or two-semester course in scanning probe microscopy; applied scanning probe techniques; or nanotribology/nanomechanics/nanotechnology, in departments such as mechanical engineering, materials science, and applied physics.

This second, revised edition is substantially enlarged by three new chapters: One new chapter introduces to the theory, physics and characterization of the Lotus-Effect. Other new chapters discuss the attaching properties of hairs as realized at gecko feet and present a comprehensive review of structural, mechanical, and tribological properties of various hair and skin as a function of ethnicity, damage, conditioning treatment, and various environments.

With a Foreword by Physics Nobel Laureate Gerd Binnig

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