Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces Reviews

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

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Metal Clusters at Surfaces: Structure, Quantum Properties, Physical Chemistry

Metal Clusters at Surfaces: Structure, Quantum Properties, Physical Chemistry

Numerous experiments and calculations have shown that isolated metal clusters possess many interesting features, quite different from those known from surface and solid- state physics or from atomic and molecular physics. The technological exploitation of these new properties, e.g. in miniature electronic or mechanical components, requires the cluster to be brought into an environment such as an encapsulating matrix or a surface. Due to the interaction with the contact medium, the properties of the clusters may change or even disappear. Thus the physics of cluster-on-surface systems — the main subject of this book — is of fundamental importance. The book addresses a wide audience, from the newcomer to the expert. Starting from fundamental concepts of adsorbate-surface interactions, the modification of electronic properties through electron confinement, and concepts of cluster production, it elucidates the distinct properties of the new metallic nanostructures.

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Rough surfaces induce silicon nanowire growth

Silicon nanowires produced at low temperatures without the use of any growth-inducing metal nanoparticles
nanotechweb.org: lab talk

Multiscale Dissipative Mechanisms and Hierarchical Surfaces: Friction, Superhydrophobicity, and Biomimetics

Multiscale Dissipative Mechanisms and Hierarchical Surfaces: Friction, Superhydrophobicity, and Biomimetics

Multiscale Dissipative Mechanisms and Hierarchical Surfaces covers the rapidly developing topics of hierarchical surfaces, roughness-induced superhydrophobicity and biomimetic surfaces. The research in these topics has been progressing rapidly in the recent years due to the advances in the nanosciences and surfaces science and due to potential applications in nanotechnology. The first in its field, this monograph provides a comprehensive review of these subjects and presents the background introduction as well as recent and new results in the area.

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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Product Description

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

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