Diffraction Analysis of the Microstructure of Materials

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Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

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Nanolithography: A Borderland between STM, EB, IB, and X-Ray Lithographies

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Success in the fabrication of structures at the nanometer length scale has opened up a new horizon to condensed matter physics: the study of quantum phenomena in confined boxes, wires, rings, etc. A new class of electronic devices based on this physics has been proposed, with the promise of a new functionality for ultrafast and/or ultradense electronic circuits. Such applications demand highly sophisticated fabrication techniques, the crucial one being lithography. Nanolithography contains updated reviews by major experts on the well established techniques — electron beam lithography (EBL), X-ray lithography (XRL), ion beam lithography (IBL) — as well as on emergent techniques, such as scanning tunnelling lithography (STL).

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Micro and Nanomanufacturing

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Nanofabrication and nanotechnology present a great challenge to engineers and researchers as they manipulate atoms and molecules to produce single artifacts and submicron components and systems.

Micro and Nanomanufacturing provides a comprehensive treatment of established micro and nanofabrication techniques and addresses the needs of practicing manufacturing engineers by applying established and research laboratory manufacturing techniques to a wide variety of materials.

Engineers seeking more knowledge of how nano and micro devices are designed and fabricated will learn about: Manufacturing and fabrication techniques at the micro and nanoscales; Using bulk and surface micromachining techniques, LiGA, and deep x-ray lithography to manufacture semiconductors; Producing master molds with micromachining; The deposition of thin films, pulsed water drop machining, and nanomachining.

Mark J. Jackson is an Associate Professor in the Department of Mechanical Engineering Technology at Purdue University. His current research focuses on understanding the properties of materials in the field of micro scale metal cutting, micro and nano abrasive machining, and laser micro machining.

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Introduction to XAFS: A Practical Guide to X-ray Absorption Fine Structure Spectroscopy

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X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.

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The Physics of Ferroelectric and Antiferroelectric Liquid Crystals

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This book presents the basic physics of ferroelectric and antiferroelectric liquid crystals in a simple and transparent way. It treats both the basic and the applied aspects of ferroelectric and antiferroelectric liquid crystal research, starting from the discovery of ferroelectricity in liquid crystals in 1975 and ending with the resonant X-ray experiment in ferrielectric and antiferrielectric phases in 1998. Particular attention is paid to the optical properties, electrooptic effects, phase transitions and experimental methods used in liquid crystal research. Special chapters are devoted to dielectric spectroscopy, light scattering, NMR, STM and AFM in complex fluids. The more than 300 illustrations help to present the basic physics of liquid crystalline ferroelectrics and antiferroelectrics in a way that can be easily followed by students, engineers and scientists dealing with liquid crystal research.

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